Changeset fd312d5 in mainline for uspace/lib/drv/include/usbdiag_iface.h

Timestamp:

2017-12-20T16:06:56Z (6 years ago)

Author:

Petr Mánek <petr.manek@…>

Branches:

lfn, master, serial, ticket/834-toolchain-update, topic/msim-upgrade, topic/simplify-dev-export

Children:

cec130b

Parents:

f98f4b7

Message:

usbdiag: more robust testing framework, added bulk in stress test, refactored remote usbdiag interface, new command for tmon

File:

• uspace/lib/drv/include/usbdiag_iface.h (modified) (1 diff)

uspace/lib/drv/include/usbdiag_iface.h

@@ -45 +45 @@
 async_sess_t *usbdiag_connect(devman_handle_t);
 void usbdiag_disconnect(async_sess_t*);
-int usbdiag_test(async_exch_t*, int, int*);
+int usbdiag_stress_bulk_in(async_exch_t*, int, size_t);
+int usbdiag_stress_bulk_out(async_exch_t*, int, size_t);
 
 /** USB diagnostic device communication interface. */
 typedef struct {
-        int (*test)(ddf_fun_t*, int, int*);
+        int (*stress_bulk_in)(ddf_fun_t*, int, size_t);
+        int (*stress_bulk_out)(ddf_fun_t*, int, size_t);
 } usbdiag_iface_t;