source: mainline/uspace/app/tester/tester.h@ 3f45993

lfn serial ticket/834-toolchain-update topic/msim-upgrade topic/simplify-dev-export
Last change on this file since 3f45993 was 3f45993, checked in by Vojtech Horky <vojtechhorky@…>, 15 years ago

Add structure for keeping track of used USB addreses

Simple test is in tester::usbaddrkeep.

  • Property mode set to 100644
File size: 2.8 KB
Line 
1/*
2 * Copyright (c) 2007 Martin Decky
3 * All rights reserved.
4 *
5 * Redistribution and use in source and binary forms, with or without
6 * modification, are permitted provided that the following conditions
7 * are met:
8 *
9 * - Redistributions of source code must retain the above copyright
10 * notice, this list of conditions and the following disclaimer.
11 * - Redistributions in binary form must reproduce the above copyright
12 * notice, this list of conditions and the following disclaimer in the
13 * documentation and/or other materials provided with the distribution.
14 * - The name of the author may not be used to endorse or promote products
15 * derived from this software without specific prior written permission.
16 *
17 * THIS SOFTWARE IS PROVIDED BY THE AUTHOR ``AS IS'' AND ANY EXPRESS OR
18 * IMPLIED WARRANTIES, INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES
19 * OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE ARE DISCLAIMED.
20 * IN NO EVENT SHALL THE AUTHOR BE LIABLE FOR ANY DIRECT, INDIRECT,
21 * INCIDENTAL, SPECIAL, EXEMPLARY, OR CONSEQUENTIAL DAMAGES (INCLUDING, BUT
22 * NOT LIMITED TO, PROCUREMENT OF SUBSTITUTE GOODS OR SERVICES; LOSS OF USE,
23 * DATA, OR PROFITS; OR BUSINESS INTERRUPTION) HOWEVER CAUSED AND ON ANY
24 * THEORY OF LIABILITY, WHETHER IN CONTRACT, STRICT LIABILITY, OR TORT
25 * (INCLUDING NEGLIGENCE OR OTHERWISE) ARISING IN ANY WAY OUT OF THE USE OF
26 * THIS SOFTWARE, EVEN IF ADVISED OF THE POSSIBILITY OF SUCH DAMAGE.
27 */
28
29/** @addtogroup tester
30 * @{
31 */
32/** @file
33 */
34
35#ifndef TESTER_H_
36#define TESTER_H_
37
38#include <sys/types.h>
39#include <bool.h>
40#include <ipc/ipc.h>
41
42#define IPC_TEST_SERVICE 10240
43#define IPC_TEST_METHOD 2000
44
45extern bool test_quiet;
46extern int test_argc;
47extern char **test_argv;
48
49#define TPRINTF(format, ...) \
50 { \
51 if (!test_quiet) { \
52 fprintf(stderr, format, ##__VA_ARGS__); \
53 } \
54 }
55
56typedef const char *(*test_entry_t)(void);
57
58typedef struct {
59 const char *name;
60 const char *desc;
61 test_entry_t entry;
62 bool safe;
63} test_t;
64
65extern const char *test_thread1(void);
66extern const char *test_print1(void);
67extern const char *test_print2(void);
68extern const char *test_print3(void);
69extern const char *test_print4(void);
70extern const char *test_print5(void);
71extern const char *test_console1(void);
72extern const char *test_stdio1(void);
73extern const char *test_stdio2(void);
74extern const char *test_fault1(void);
75extern const char *test_fault2(void);
76extern const char *test_fault3(void);
77extern const char *test_vfs1(void);
78extern const char *test_ping_pong(void);
79extern const char *test_register(void);
80extern const char *test_connect(void);
81extern const char *test_loop1(void);
82extern const char *test_malloc1(void);
83extern const char *test_serial1(void);
84extern const char *test_usbaddrkeep(void);
85
86extern test_t tests[];
87
88#endif
89
90/** @}
91 */
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