Changeset fd312d5 in mainline for uspace/lib/drv/generic/remote_usbdiag.c

Timestamp:

2017-12-20T16:06:56Z (6 years ago)

Author:

Petr Mánek <petr.manek@…>

Branches:

lfn, master, serial, ticket/834-toolchain-update, topic/msim-upgrade, topic/simplify-dev-export

Children:

cec130b

Parents:

f98f4b7

Message:

usbdiag: more robust testing framework, added bulk in stress test, refactored remote usbdiag interface, new command for tmon

File:

• uspace/lib/drv/generic/remote_usbdiag.c (modified) (3 diffs)

uspace/lib/drv/generic/remote_usbdiag.c

@@ -43 +43 @@
 
 typedef enum {
-        IPC_M_USBDIAG_TEST,
+        IPC_M_USBDIAG_STRESS_BULK_OUT,
+        IPC_M_USBDIAG_STRESS_BULK_IN
 } usb_iface_funcs_t;
 
@@ -57 +58 @@
 }
 
-int usbdiag_test(async_exch_t *exch, int x, int *y)
+int usbdiag_stress_bulk_out(async_exch_t *exch, int cycles, size_t size)
 {
         if (!exch)
                 return EBADMEM;
 
-        sysarg_t y_;
-        const int ret = async_req_2_1(exch, DEV_IFACE_ID(USBDIAG_DEV_IFACE), IPC_M_USBDIAG_TEST, x, &y_);
-
-        if (y)
-                *y = (int) y_;
-
-        return ret;
+        return async_req_3_0(exch, DEV_IFACE_ID(USBDIAG_DEV_IFACE), IPC_M_USBDIAG_STRESS_BULK_OUT, cycles, size);
 }
 
-static void remote_usbdiag_test(ddf_fun_t *, void *, ipc_callid_t, ipc_call_t *);
+int usbdiag_stress_bulk_in(async_exch_t *exch, int cycles, size_t size)
+{
+        if (!exch)
+                return EBADMEM;
+
+        return async_req_3_0(exch, DEV_IFACE_ID(USBDIAG_DEV_IFACE), IPC_M_USBDIAG_STRESS_BULK_IN, cycles, size);
+}
+
+static void remote_usbdiag_stress_bulk_out(ddf_fun_t *, void *, ipc_callid_t, ipc_call_t *);
+static void remote_usbdiag_stress_bulk_in(ddf_fun_t *, void *, ipc_callid_t, ipc_call_t *);
 
 /** Remote USB diagnostic interface operations. */
 static const remote_iface_func_ptr_t remote_usbdiag_iface_ops [] = {
-        [IPC_M_USBDIAG_TEST] = remote_usbdiag_test,
+        [IPC_M_USBDIAG_STRESS_BULK_OUT] = remote_usbdiag_stress_bulk_out,
+        [IPC_M_USBDIAG_STRESS_BULK_IN] = remote_usbdiag_stress_bulk_in,
 };
 
@@ -84 +89 @@
 };
 
-void remote_usbdiag_test(ddf_fun_t *fun, void *iface, ipc_callid_t callid, ipc_call_t *call)
+void remote_usbdiag_stress_bulk_out(ddf_fun_t *fun, void *iface, ipc_callid_t callid, ipc_call_t *call)
 {
         const usbdiag_iface_t *diag_iface = (usbdiag_iface_t *) iface;
 
-        if (diag_iface->test == NULL) {
+        if (diag_iface->stress_bulk_out == NULL) {
                 async_answer_0(callid, ENOTSUP);
                 return;
         }
 
-        int x = DEV_IPC_GET_ARG1(*call);
-        int y;
-        const int ret = diag_iface->test(fun, x, &y);
-        if (ret != EOK) {
-                async_answer_0(callid, ret);
-        } else {
-                async_answer_1(callid, EOK, y);
+        int cycles = DEV_IPC_GET_ARG1(*call);
+        size_t size = DEV_IPC_GET_ARG2(*call);
+        const int ret = diag_iface->stress_bulk_out(fun, cycles, size);
+        async_answer_0(callid, ret);
+}
+
+void remote_usbdiag_stress_bulk_in(ddf_fun_t *fun, void *iface, ipc_callid_t callid, ipc_call_t *call)
+{
+        const usbdiag_iface_t *diag_iface = (usbdiag_iface_t *) iface;
+
+        if (diag_iface->stress_bulk_in == NULL) {
+                async_answer_0(callid, ENOTSUP);
+                return;
         }
+
+        int cycles = DEV_IPC_GET_ARG1(*call);
+        size_t size = DEV_IPC_GET_ARG2(*call);
+        const int ret = diag_iface->stress_bulk_in(fun, cycles, size);
+        async_answer_0(callid, ret);
 }