Changeset b7b7898 in mainline for uspace/drv/bus/usb/usbdiag/tests.h

Timestamp:

2017-12-22T12:03:16Z (6 years ago)

Author:

Petr Mánek <petr.manek@…>

Branches:

lfn, master, serial, ticket/834-toolchain-update, topic/msim-upgrade, topic/simplify-dev-export

Children:

96c416a

Parents:

2986763

git-author:

Petr Mánek <petr.manek@…> (2017-12-22 12:02:50)

git-committer:

Petr Mánek <petr.manek@…> (2017-12-22 12:03:16)

Message:

usbdiag: refactoring

Reconciliated the usb_diag and usbdiag prefix in favor of the latter. Removed a ton of copy-pasta code for the burst tests in favor of single generic static burst test for every direction, which is then called by individual functions for different endpoint type. This also allowed to get rid of the ugly translation macros in device.c. Deleted unused usbdiag.h header file. Refactored the remote interface to comply with all aforementioned modifications.

File:

• uspace/drv/bus/usb/usbdiag/tests.h (modified) (1 diff)

uspace/drv/bus/usb/usbdiag/tests.h

@@ -34 +34 @@
  */
 
-#ifndef USB_DIAG_TESTS_H_
-#define USB_DIAG_TESTS_H_
+#ifndef USBDIAG_TESTS_H_
+#define USBDIAG_TESTS_H_
 
-#include "device.h"
+#include <ddf/driver.h>
 
-int usb_diag_stress_intr_out(usb_diag_dev_t *, int, size_t);
-int usb_diag_stress_intr_in(usb_diag_dev_t *, int, size_t);
-int usb_diag_stress_bulk_out(usb_diag_dev_t *, int, size_t);
-int usb_diag_stress_bulk_in(usb_diag_dev_t *, int, size_t);
-int usb_diag_stress_isoch_out(usb_diag_dev_t *, int, size_t);
-int usb_diag_stress_isoch_in(usb_diag_dev_t *, int, size_t);
+int usbdiag_burst_test_intr_in(ddf_fun_t *, int, size_t);
+int usbdiag_burst_test_intr_out(ddf_fun_t *, int, size_t);
+int usbdiag_burst_test_bulk_in(ddf_fun_t *, int, size_t);
+int usbdiag_burst_test_bulk_out(ddf_fun_t *, int, size_t);
+int usbdiag_burst_test_isoch_in(ddf_fun_t *, int, size_t);
+int usbdiag_burst_test_isoch_out(ddf_fun_t *, int, size_t);
 
-#endif /* USB_DIAG_TESTS_H_ */
+#endif /* USBDIAG_TESTS_H_ */
 
 /**